Bonjour moko138,
Merci pour ta réponse, voici ce que ça donne :
sudo smartctl -s on -a /dev/sda
smartctl 6.5 2016-01-24 r4214 [i686-linux-4.13.0-36-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke,
www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Travelstar 5K100
Device Model: HTS541010G9AT00
Serial Number: MP20XAX0KAPTES
Firmware Version: MBZOA60A
User Capacity: 100 030 242 816 bytes [100 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-6 T13/1410D revision 3a
Local Time is: Tue Feb 27 08:07:05 2018 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Enabled.
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 66) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 098 098 062 Pre-fail Always - 262144
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 230 230 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0012 092 092 000 Old_age Always - 13285
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 072 072 000 Old_age Always - 12372
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 6525
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 90
193 Load_Cycle_Count 0x0012 047 047 000 Old_age Always - 534778
194 Temperature_Celsius 0x0002 183 183 000 Old_age Always - 30 (Min/Max 13/57)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 2
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 218 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 218 occurred at disk power-on lifetime: 12371 hours (515 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 05 73 a3 f0 e0 Error: UNC 5 sectors at LBA = 0x00f0a373 = 15770483
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 70 a3 f0 e0 00 02:27:08.100 READ DMA
c8 00 08 68 a3 f0 e0 00 02:27:08.100 READ DMA
c8 00 08 60 a3 f0 e0 00 02:27:08.100 READ DMA
c8 00 08 58 a3 f0 e0 00 02:27:08.100 READ DMA
c8 00 08 50 a3 f0 e0 00 02:27:08.100 READ DMA
Error 217 occurred at disk power-on lifetime: 12371 hours (515 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0d 73 a3 f0 e0 Error: UNC 13 sectors at LBA = 0x00f0a373 = 15770483
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 80 a2 f0 e0 00 02:27:03.900 READ DMA
c8 00 00 80 a1 f0 e0 00 02:27:03.900 READ DMA
c8 00 00 80 a0 f0 e0 00 02:27:03.900 READ DMA
c8 00 00 80 9f f0 e0 00 02:27:03.900 READ DMA
c8 00 00 80 9e f0 e0 00 02:27:03.800 READ DMA
Error 216 occurred at disk power-on lifetime: 12371 hours (515 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 05 73 a3 f0 e0 Error: UNC 5 sectors at LBA = 0x00f0a373 = 15770483
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 70 a3 f0 e0 00 02:24:14.500 READ DMA
c8 00 08 68 a3 f0 e0 00 02:24:14.500 READ DMA
c8 00 08 60 a3 f0 e0 00 02:24:14.500 READ DMA
c8 00 08 58 a3 f0 e0 00 02:24:14.500 READ DMA
c8 00 08 50 a3 f0 e0 00 02:24:14.500 READ DMA
Error 215 occurred at disk power-on lifetime: 12371 hours (515 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0d 73 a3 f0 e0 Error: UNC 13 sectors at LBA = 0x00f0a373 = 15770483
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 80 a2 f0 e0 00 02:24:10.200 READ DMA
c8 00 00 80 a1 f0 e0 00 02:24:10.200 READ DMA
c8 00 00 80 a0 f0 e0 00 02:24:10.200 READ DMA
c8 00 00 80 9f f0 e0 00 02:24:10.100 READ DMA
c8 00 00 80 9e f0 e0 00 02:24:10.100 READ DMA
Error 214 occurred at disk power-on lifetime: 12371 hours (515 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 05 73 a3 f0 e0 Error: UNC 5 sectors at LBA = 0x00f0a373 = 15770483
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 70 a3 f0 e0 00 01:39:18.000 READ DMA
c8 00 90 f0 a3 f0 e0 00 01:39:18.000 READ DMA
c8 00 f0 80 a2 f0 e0 00 01:39:18.000 READ DMA
c8 00 00 80 a1 f0 e0 00 01:39:18.000 READ DMA
c8 00 00 80 a0 f0 e0 00 01:39:18.000 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
