Bon, voici le résultat. Il ne calme pas mon inquiétude 🙂...
geoffroy@geoffroy-Aspire-ES1-523:~$ sudo smartctl -d sat -a /dev/sdb
[sudo] Mot de passe de geoffroy :
smartctl 6.6 2016-05-31 r4324 [i686-linux-4.15.0-33-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA MQ04ABF100
Serial Number: 37IFC42MT
LU WWN Device Id: 5 000039 7a3a06d7b
Firmware Version: JU000U
User Capacity: 1000204886016 bytes [1,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA >3.2 (0x1ff), 6.0 Gb/s (current: 1.5 Gb/s)
Local Time is: Sun Sep 9 19:50:41 2018 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 183) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 3076
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 1217
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 403
10 Spin_Retry_Count 0x0033 124 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 376
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 7
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 67
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 2344
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 29 (Min/Max 8/49)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 8
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 14
222 Loaded_Hours 0x0032 100 100 000 Old_age Always - 40
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 191
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 1627 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1627 occurred at disk power-on lifetime: 402 hours (16 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 06 2a 9d 03 40 Error: UNC 6 sectors at LBA = 0x00039d2a = 236842
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 da 06 2a 9d 03 40 00 00:00:20.643 READ DMA EXT
25 da 01 29 9d 03 40 00 00:00:20.265 READ DMA EXT
25 da 01 28 9d 03 40 00 00:00:19.888 READ DMA EXT
25 da 08 28 9d 03 40 00 00:00:19.490 READ DMA EXT
25 da 08 88 08 02 40 00 00:00:19.489 READ DMA EXT
Error 1626 occurred at disk power-on lifetime: 402 hours (16 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 29 9d 03 40 Error: UNC 1 sectors at LBA = 0x00039d29 = 236841
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 da 01 29 9d 03 40 00 00:00:20.265 READ DMA EXT
25 da 01 28 9d 03 40 00 00:00:19.888 READ DMA EXT
25 da 08 28 9d 03 40 00 00:00:19.490 READ DMA EXT
25 da 08 88 08 02 40 00 00:00:19.489 READ DMA EXT
25 da 10 80 f4 02 40 00 00:00:19.486 READ DMA EXT
Error 1625 occurred at disk power-on lifetime: 402 hours (16 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 28 9d 03 40 Error: UNC 1 sectors at LBA = 0x00039d28 = 236840
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 da 01 28 9d 03 40 00 00:00:19.888 READ DMA EXT
25 da 08 28 9d 03 40 00 00:00:19.490 READ DMA EXT
25 da 08 88 08 02 40 00 00:00:19.489 READ DMA EXT
25 da 10 80 f4 02 40 00 00:00:19.486 READ DMA EXT
25 da f0 90 f3 02 40 00 00:00:19.482 READ DMA EXT
Error 1624 occurred at disk power-on lifetime: 402 hours (16 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 28 9d 03 40 Error: UNC 8 sectors at LBA = 0x00039d28 = 236840
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 da 08 28 9d 03 40 00 00:00:19.490 READ DMA EXT
25 da 08 88 08 02 40 00 00:00:19.489 READ DMA EXT
25 da 10 80 f4 02 40 00 00:00:19.486 READ DMA EXT
25 da f0 90 f3 02 40 00 00:00:19.482 READ DMA EXT
25 da 20 10 08 60 40 00 00:00:19.481 READ DMA EXT
Error 1623 occurred at disk power-on lifetime: 402 hours (16 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 06 2a 9d 03 40 Error: UNC 6 sectors at LBA = 0x00039d2a = 236842
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 da 06 2a 9d 03 40 00 00:00:11.810 READ DMA EXT
25 da 01 29 9d 03 40 00 00:00:11.432 READ DMA EXT
25 da 01 28 9d 03 40 00 00:00:11.054 READ DMA EXT
25 da 08 28 9d 03 40 00 00:00:10.680 READ DMA EXT
25 da 08 88 08 02 40 00 00:00:10.667 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.