Merci pour ta réponse
Voici le résultat. Bon, pour moi, c'est toujours une langue étrangère.
jean-yves@P7612:~$ sudo smartctl --scan | grep -i usb
[sudo] Mot de passe de jean-yves :
/dev/sdb -d usbjmicron # /dev/sdb [USB JMicron], ATA device
jean-yves@P7612:~$ sudo smartctl -s on -a -d usbjmicron /dev/sdb
smartctl 6.6 2016-05-31 r4324 [i686-linux-4.4.0-134-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi/HGST Travelstar Z5K500
Device Model: Hitachi HTS545050A7E380
Serial Number: TEJ51239HLS4YX
LU WWN Device Id: 5 000cca 71ed69d1f
Firmware Version: GG2OA6C0
User Capacity: 500 107 862 016 bytes [500 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Thu Oct 11 11:13:15 2018 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Enabled.
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 113) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 076 076 062 Pre-fail Always - 37618908
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 222 222 033 Pre-fail Always - 1
4 Start_Stop_Count 0x0012 096 096 000 Old_age Always - 7497
5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always FAILING_NOW 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 097 097 000 Old_age Always - 1384
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1791
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 92
193 Load_Cycle_Count 0x0012 097 097 000 Old_age Always - 35721
194 Temperature_Celsius 0x0002 253 253 000 Old_age Always - 21 (Min/Max 13/44)
196 Reallocated_Event_Count 0x0032 002 002 000 Old_age Always - 2459
197 Current_Pending_Sector 0x0022 089 089 000 Old_age Always - 464
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 24636 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 24636 occurred at disk power-on lifetime: 1384 hours (57 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 30 d0 0b 00 00 Error: UNC 48 sectors at LBA = 0x00000bd0 = 3024
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 40 c0 0b 00 e0 00 00:00:37.867 READ DMA EXT
25 00 40 80 0b 00 e0 00 00:00:31.840 READ DMA EXT
ef 03 46 00 00 00 a0 00 00:00:31.839 SET FEATURES [Set transfer mode]
25 00 30 90 0b 00 00 04 00:00:31.821 READ DMA EXT
25 00 40 80 0b 00 e0 00 00:00:28.122 READ DMA EXT
Error 24635 occurred at disk power-on lifetime: 1384 hours (57 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 30 90 0b 00 00 Error: UNC 48 sectors at LBA = 0x00000b90 = 2960
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 40 80 0b 00 e0 00 00:00:28.122 READ DMA EXT
25 00 40 40 0b 00 e0 00 00:00:27.822 READ DMA EXT
25 00 40 00 0b 00 e0 00 00:00:27.767 READ DMA EXT
25 00 40 c0 08 00 e0 00 00:00:27.765 READ DMA EXT
25 00 40 80 08 00 e0 00 00:00:27.764 READ DMA EXT
Error 24634 occurred at disk power-on lifetime: 1384 hours (57 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 a8 0b 00 00 Error: UNC 8 sectors at LBA = 0x00000ba8 = 2984
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 a8 0b 00 e0 00 00:00:18.424 READ DMA EXT
25 00 08 a0 0b 00 e0 00 00:00:18.424 READ DMA EXT
25 00 08 98 0b 00 e0 00 00:00:18.357 READ DMA EXT
25 00 08 90 0b 00 e0 00 00:00:17.347 READ DMA EXT
25 00 08 88 0b 00 e0 00 00:00:17.346 READ DMA EXT
Error 24633 occurred at disk power-on lifetime: 1384 hours (57 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 10 f0 0b 00 00 Error: UNC 16 sectors at LBA = 0x00000bf0 = 3056
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 10 f0 0b 00 e0 00 00:00:13.578 READ DMA EXT
e1 00 00 00 00 00 a0 00 00:00:13.556 IDLE IMMEDIATE
25 00 f0 00 0b 00 e0 00 00:00:02.915 READ DMA EXT
25 00 10 f0 0a 00 e0 00 00:00:02.913 READ DMA EXT
25 00 f0 00 0a 00 e0 00 00:00:02.900 READ DMA EXT
Error 24632 occurred at disk power-on lifetime: 1383 hours (57 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 70 90 0b 00 00 Error: UNC at LBA = 0x00000b90 = 2960
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 a0 00 0b 00 40 08 00:16:38.890 READ FPDMA QUEUED
60 00 98 00 0a 00 40 08 00:16:38.889 READ FPDMA QUEUED
60 f0 90 10 09 00 40 08 00:16:38.876 READ FPDMA QUEUED
60 90 88 80 08 00 40 08 00:16:38.875 READ FPDMA QUEUED
60 10 80 68 08 00 40 08 00:16:38.875 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
jean-yves@P7612:~$
