@moko138
Effectivement le connecteur USB est là ou tu as ajouté les flèches
Et effectivement il n'y a pas de connecteur SATA (je connais moins bien le PATA mais je ne pense pas qu'il y en avait)
Le connecteur que moi j'ai entouré coté carte va sur celui coté disque, mais il est tout petit (1,5 cm sur 1 cm maxi) - a vrai dire ce n'est pas un connecteur mais ça fait la connexion entre disque et carte.
Tu as raison il y avait a la fois le nom Seagte et Samsung sur le disque (ça m'avait un peu troublé d'ailleurs)
Voici le résultat des 2 commandes (je suppose qu'il va falloir refaire le deuxième commande avec une option 0 ou 1)
CLEVO:~$ sudo smartctl -a /dev/sdb
[sudo] Mot de passe de xwop :
smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-159-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
Warning! Drive Identity Structure error: invalid SMART checksum.
=== START OF INFORMATION SECTION ===
Device Model: ST500LM016 HN-M500XBB
Serial Number: C7563G12AA96Y7
LU WWN Device Id: 5 0000f0 0aa0b0796
Firmware Version: 2AR10001
User Capacity: 500 107 861 504 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 1.5 Gb/s)
Local Time is: Fri Sep 6 17:19:48 2019 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6420) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 107) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0
2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0
3 Spin_Up_Time 0x0023 086 086 025 Pre-fail Always - 4465
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 43
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 4
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 66
181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 202603
191 G-Sense_Error_Rate 0x0022 252 252 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
194 Temperature_Celsius 0x0002 064 064 000 Old_age Always - 24 (Min/Max 22/32)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 0
223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0
225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 358
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Puis
CLEVO:~$ sudo smartctl -d usbjmicron,2 -a /dev/sdb
smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-159-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
/dev/sdb: Option '-d usbjmicron[,p][,x],<n>' requires <n> to be 0 or 1
=======> VALID ARGUMENTS ARE: ata, scsi, sat[,auto][,N][+TYPE], usbcypress[,X], usbjmicron[,p][,x][,N], usbsunplus, marvell, areca,N/E, 3ware,N, hpt,L/M/N, megaraid,N, aacraid,H,L,ID, cciss,N, auto, test <=======
Use smartctl -h to get a usage summary
