Le voici :
flp@flp-desktop:~$ sudo smartctl -s on -a /dev/sdg
[sudo] Mot de passe de flp :
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-5.3.0-45-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Travelstar 5K500.B
Device Model: Hitachi HTS545050B9A300
Serial Number: 101015PBN40417FAYPYE
LU WWN Device Id: 5 000cca 5f1ef41be
Firmware Version: PB4OC64G
User Capacity: 500107862016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Thu May 7 15:01:42 2020 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Enabled.
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 117) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 158) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 099 099 062 Pre-fail Always - 131072
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 131 131 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1246
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 089 089 000 Old_age Always - 5128
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1075
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 098 098 000 Old_age Always - 543
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 1246
194 Temperature_Celsius 0x0002 130 130 000 Old_age Always - 42 (Min/Max 12/52)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 86
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 19
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1649 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1649 occurred at disk power-on lifetime: 5125 hours (213 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 51 95 86 e9 Error: UNC 8 sectors at LBA = 0x09869551 = 159814993
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 51 95 86 e0 00 1d+01:13:01.000 READ DMA EXT
35 00 01 c3 b3 7d e0 00 1d+01:13:01.000 WRITE DMA EXT
ef 03 46 00 00 00 a0 00 1d+01:13:01.000 SET FEATURES [Set transfer mode]
25 00 08 51 95 86 e9 04 1d+01:13:01.000 READ DMA EXT
25 00 08 51 95 86 e0 00 1d+01:12:57.100 READ DMA EXT
Error 1648 occurred at disk power-on lifetime: 5125 hours (213 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 51 95 86 e9 Error: UNC 8 sectors at LBA = 0x09869551 = 159814993
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 51 95 86 e0 00 1d+01:12:57.100 READ DMA EXT
25 00 08 49 95 86 e0 00 1d+01:12:57.100 READ DMA EXT
25 00 08 41 95 86 e0 00 1d+01:12:57.100 READ DMA EXT
25 00 08 39 95 86 e0 00 1d+01:12:57.100 READ DMA EXT
25 00 08 31 95 86 e0 00 1d+01:12:57.100 READ DMA EXT
Error 1647 occurred at disk power-on lifetime: 5125 hours (213 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 30 51 95 86 e9 Error: UNC 48 sectors at LBA = 0x09869551 = 159814993
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 01 95 86 e0 00 1d+01:12:53.200 READ DMA EXT
25 00 80 81 93 86 e0 00 1d+01:12:53.200 READ DMA EXT
25 00 80 01 93 86 e0 00 1d+01:12:53.200 READ DMA EXT
25 00 80 81 91 86 e0 00 1d+01:12:53.200 READ DMA EXT
25 00 80 01 91 86 e0 00 1d+01:12:53.200 READ DMA EXT
Error 1646 occurred at disk power-on lifetime: 5125 hours (213 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 07 8a 8b 86 e9 Error: UNC 7 sectors at LBA = 0x09868b8a = 159812490
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 89 8b 86 e0 00 1d+01:12:41.200 READ DMA EXT
ef 03 46 00 00 00 a0 00 1d+01:12:41.200 SET FEATURES [Set transfer mode]
25 00 07 8a 8b 86 e9 04 1d+01:12:41.100 READ DMA EXT
25 00 08 89 8b 86 e0 00 1d+01:12:37.300 READ DMA EXT
25 00 08 81 8b 86 e0 00 1d+01:12:37.300 READ DMA EXT
Error 1645 occurred at disk power-on lifetime: 5125 hours (213 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 07 8a 8b 86 e9 Error: UNC 7 sectors at LBA = 0x09868b8a = 159812490
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 89 8b 86 e0 00 1d+01:12:37.300 READ DMA EXT
25 00 08 81 8b 86 e0 00 1d+01:12:37.300 READ DMA EXT
35 00 01 c3 b3 7d e0 00 1d+01:12:37.300 WRITE DMA EXT
25 00 80 01 8d 86 e0 00 1d+01:12:37.300 READ DMA EXT
25 00 80 01 8c 86 e0 00 1d+01:12:37.300 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: read failure 50% 5127 695693123
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Merci de votre attention et de vos éclairages !
